“Probing Electrified Interface with Scanning Probe Microscopy: The Potential Profile of a Diffuse Double Layer,” , F4D4심
- Title
- “Probing Electrified Interface with Scanning Probe Microscopy: The Potential Profile of a Diffuse Double Layer,” , F4D4심
- Authors
- 박수문
- Publisher
- 대한화학회
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/84275
- Article Type
- Conference
- Citation
- 대한화학회 제88회 총회
- Files in This Item:
- There are no files associated with this item.
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