Conference
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Quantitative Analysis of Molecularly Stacked Layer Structure on Substrate by Synchrotron Grazing Incidence X-ray Scattering
- Title
- Quantitative Analysis of Molecularly Stacked Layer Structure on Substrate by Synchrotron Grazing Incidence X-ray Scattering
- Authors
- 이문호
- Publisher
- HASYLAB/DESY, Notkestr. 85, D-22607
- Article Type
- Conference
- Citation
- 2nd Workshop “GISAXS - An Advanced Scattering Method”
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.
Communities & Collection
Related Researcher
- 이문호REE, MOONHOR
- Dept of Chemistry