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Quantitative analysis of layer structure on substrate by synchrotron grazing incidence X-ray scattering
- Title
- Quantitative analysis of layer structure on substrate by synchrotron grazing incidence X-ray scattering
- Authors
- 이문호
- Publisher
- Pohang Accelerator Laboratory
- Article Type
- Conference
- Citation
- The 18th Synchrotron Radiation Users’ Workshop & KOSUA Meeting
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Related Researcher
- 이문호REE, MOONHOR
- Dept of Chemistry