Quantitative Analysis of Molecularly Stacked Layer Structure on Substrate by Synchrotron Grazing Incidence X-ray Scattering
- Title
- Quantitative Analysis of Molecularly Stacked Layer Structure on Substrate by Synchrotron Grazing Incidence X-ray Scattering
- Authors
- 이문호
- Publisher
- BEXCO, Busan, Korea
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/85874
- Article Type
- Conference
- Citation
- 2006 PSK Annual Fall Scientific Meeting
- Files in This Item:
- There are no files associated with this item.
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