Full metadata record
DC Field | Value | Language |
dc.contributor.author | 박수문 | - |
dc.date.accessioned | 2018-06-22T03:25:53Z | - |
dc.date.available | 2018-06-22T03:25:53Z | - |
dc.date.created | 2009-03-27 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/86912 | - |
dc.relation.isPartOf | 214th Electrochemical Society Meeting | - |
dc.relation.isPartOf | 214th Electrochemical Society Meeting | - |
dc.title | Failure Mechanism by Organic Contaminants in Si Device Fabrication | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.identifier.bibliographicCitation | 214th Electrochemical Society Meeting | - |
dc.citation.conferenceDate | 2008-10-12 | - |
dc.citation.conferencePlace | US | - |
dc.citation.title | 214th Electrochemical Society Meeting | - |
dc.contributor.affiliatedAuthor | 박수문 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
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