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Parallel Testable Design of Neighbor Pattern Sensitive Faults in High Density DRAMs
- Title
- Parallel Testable Design of Neighbor Pattern Sensitive Faults in High Density DRAMs
- Authors
- 홍성제
- Article Type
- Conference
- Citation
- 2005 IEEE International Symposium on Circuits and Systems, page. 5854 - 5857
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Related Researcher
- 홍성제HONG, SUNG JE
- Div of IT Convergence Enginrg