Conference
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
A novel series-resistance extraction method for nano-scaled nMOSFETs considering mobility degradation due to Vbs
- Title
- A novel series-resistance extraction method for nano-scaled nMOSFETs considering mobility degradation due to Vbs
- Authors
- 정윤하
- Publisher
- IEEE
- Article Type
- Conference
- Citation
- IEEE Nanotechnology Materials and Devices Conference 2008, page. 206
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.
Communities & Collection
Related Researcher
- 정윤하JEONG, YOON HA
- Dept of Electrical Enginrg