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Hot Carrier Stress in 70-nm nMOSFET with Various Bias Conditions
- Title
- Hot Carrier Stress in 70-nm nMOSFET with Various Bias Conditions
- Authors
- 정윤하
- Publisher
- 2006 IEEE Nanotechnology Materials and Devices Conference, Gyeongju, Korea
- Article Type
- Conference
- Citation
- 2006 IEEE Nanotechnology Materials and Devices Conference, page. 320 - 321
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Related Researcher
- 정윤하JEONG, YOON HA
- Dept of Electrical Enginrg