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dc.contributor.author홍유신-
dc.date.accessioned2018-06-23T12:47:05Z-
dc.date.available2018-06-23T12:47:05Z-
dc.date.created2009-03-27-
dc.date.issued1995-03-01-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/89715-
dc.relation.isPartOfProc. of the 2nd ISSAT Int'l Conf. on Reliability & Quality in Design-
dc.relation.isPartOfProc. of the 2nd ISSAT Int'l Conf. on Reliability & Quality in Design-
dc.titleBayesian Reliability Prediction Under Event Trees-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitationProc. of the 2nd ISSAT Int'l Conf. on Reliability & Quality in Design, pp.113 - 117-
dc.citation.conferencePlaceUS-
dc.citation.endPage117-
dc.citation.startPage113-
dc.citation.titleProc. of the 2nd ISSAT Int'l Conf. on Reliability & Quality in Design-
dc.contributor.affiliatedAuthor홍유신-
dc.description.journalClass1-
dc.description.journalClass1-

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