Reliability Consideration of Ti/Pt/Au Schottky contact on GaAs MESFET
- Title
- Reliability Consideration of Ti/Pt/Au Schottky contact on GaAs MESFET
- Authors
- 이종람
- Date Issued
- 1995-01-01
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/89733
- Article Type
- Conference
- Citation
- Proceedings of 95 Int. Con. on VLSI & CAD, page. 317 - 319, 1995-01-01
- Files in This Item:
- There are no files associated with this item.
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