Conference
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Self-inspection for Defect Detection in Photomask Image
- Title
- Self-inspection for Defect Detection in Photomask Image
- Authors
- 정홍
- Article Type
- Conference
- Citation
- The 2008 International Conference on Convergence and Information Technology, page. 364 - 368
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.
Communities & Collection
Related Researcher
- 정홍JEONG, HONG
- Dept of Electrical Enginrg