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Cs-corrected STEM (JEM-2100F)와 TEM (JEM-2200FS)을 이용한 나노 재료의 성분 및 구조분석
- Title
- Cs-corrected STEM (JEM-2100F)와 TEM (JEM-2200FS)을 이용한 나노 재료의 성분 및 구조분석
- Authors
- 박찬경
- Publisher
- 한국표준과학원
- Article Type
- Conference
- Citation
- 한국현미경학회 추계학술대회
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Related Researcher
- 박찬경PARK, CHAN GYUNG
- Dept of Materials Science & Enginrg