Cs-Corrected STEM-EELS Application for Si Nano--Dots in SiO2
- Title
- Cs-Corrected STEM-EELS Application for Si Nano--Dots in SiO2
- Authors
- 박찬경
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/90450
- Article Type
- Conference
- Citation
- Front. of Elect. Microscopy in Mater. Sci. 2007, FEMMS
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- There are no files associated with this item.
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