Conference
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 이시우 | - |
| dc.date.accessioned | 2018-06-23T13:59:07Z | - |
| dc.date.available | 2018-06-23T13:59:07Z | - |
| dc.date.created | 2009-03-27 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/90525 | - |
| dc.publisher | American Vacuum Society | - |
| dc.relation.isPartOf | AVS 53rd Internation Symposium & Exhibition | - |
| dc.relation.isPartOf | AVS 53rd Internation Symposium & Exhibition | - |
| dc.title | In-Situ Diagnosis using FT-IR and the Characterization of Hf Nitride Films | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | AVS 53rd Internation Symposium & Exhibition | - |
| dc.citation.conferenceDate | 2006-11-12 | - |
| dc.citation.title | AVS 53rd Internation Symposium & Exhibition | - |
| dc.contributor.affiliatedAuthor | 이시우 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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