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TEM의 CBED (convergent beam electron diffraction)법을이용한 반도체 소자의 Strain 거동 분석

Title
TEM의 CBED (convergent beam electron diffraction)법을이용한 반도체 소자의 Strain 거동 분석
Authors
박찬경
URI
https://oasis.postech.ac.kr/handle/2014.oak/90566
Article Type
Conference
Citation
한국전자현미경학회 춘계학술대회
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박찬경PARK, CHAN GYUNG
Dept of Materials Science & Enginrg
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