Interface Structure and Defect Analyses of Perovskite Thin Films by using FE-TEM
- Title
- Interface Structure and Defect Analyses of Perovskite Thin Films by using FE-TEM
- Authors
- 박찬경
- Publisher
- 한국요업기술원, 서울
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/90580
- Article Type
- Conference
- Citation
- 2002 하반기 초청세미나
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.