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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 박찬경 | - |
| dc.date.accessioned | 2018-06-23T14:04:39Z | - |
| dc.date.available | 2018-06-23T14:04:39Z | - |
| dc.date.created | 2009-03-27 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/90587 | - |
| dc.publisher | 한양대, 서울 | - |
| dc.relation.isPartOf | 한국전자현미경학회 2002 춘계학술대회 | - |
| dc.relation.isPartOf | 한국전자현미경학회 2002 춘계학술대회 | - |
| dc.title | Nano-probe TEM analyses for thin films and quantum devices | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | 한국전자현미경학회 2002 춘계학술대회 | - |
| dc.citation.conferenceDate | 2002-05-25 | - |
| dc.citation.title | 한국전자현미경학회 2002 춘계학술대회 | - |
| dc.contributor.affiliatedAuthor | 박찬경 | - |
| dc.description.journalClass | 2 | - |
| dc.description.journalClass | 2 | - |
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Related Researcher
- 박찬경PARK, CHAN GYUNG
- Dept of Materials Science & Enginrg