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Characterization of Heusler Alloy Thin Film, Cu2MnAl and Co2MnSi, Deposited by Co-sputtering Method

Title
Characterization of Heusler Alloy Thin Film, Cu2MnAl and Co2MnSi, Deposited by Co-sputtering Method
Authors
권순주
Publisher
2003 SOMMA / KMS meeting
URI
https://oasis.postech.ac.kr/handle/2014.oak/91921
Article Type
Conference
Citation
2003 SOMMA / KMS meeting
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권순주KWON, SOON JU
Dept of Materials Science & Enginrg
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