Characterization of Heusler Alloy Thin Film, Cu2MnAl and Co2MnSi, Deposited by Co-sputtering Method
- Title
- Characterization of Heusler Alloy Thin Film, Cu2MnAl and Co2MnSi, Deposited by Co-sputtering Method
- Authors
- 권순주
- Publisher
- 2003 SOMMA / KMS meeting
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/91921
- Article Type
- Conference
- Citation
- 2003 SOMMA / KMS meeting
- Files in This Item:
- There are no files associated with this item.
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