DC Field | Value | Language |
---|---|---|
dc.contributor.author | Moon, Seokbae | - |
dc.contributor.author | Jeong, Hyeyun | - |
dc.contributor.author | Lee, Hojin | - |
dc.contributor.author | Kim, Sang Woo | - |
dc.date.accessioned | 2018-07-16T09:42:11Z | - |
dc.date.available | 2018-07-16T09:42:11Z | - |
dc.date.created | 2017-12-21 | - |
dc.date.issued | 2017-12 | - |
dc.identifier.issn | 0278-0046 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/91975 | - |
dc.description.abstract | We present a method that detects and classifies demagnetization and interturn short faults (ISFs), which degrade the performance of permanent-magnet synchronous machines (PMSMs). Demagnetization and ISF are analyzed using models; we focused on changes of magnitude and angle of currents in the synchronous frame. Those two faults increase the magnitude of the input current compared with normal machines at the same load torque. However, our analysis suggests that demagnetization causes increase in the current angle beta, whereas ISF causes decrease in beta. We exploit this difference in response to classify the fault if one is detected in the PMSM. Experimental studies on interior-type PMSMs verify that demagnetization and ISF can be detected and classified in various operation conditions. | - |
dc.language | English | - |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
dc.relation.isPartOf | IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS | - |
dc.title | Detection and Classification of Demagnetization and Interturn Short Faults of IPMSMs | - |
dc.type | Article | - |
dc.identifier.doi | 10.1109/TIE.2017.2703919 | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, v.64, no.12, pp.9433 - 9441 | - |
dc.identifier.wosid | 000413946800025 | - |
dc.date.tcdate | 2019-02-01 | - |
dc.citation.endPage | 9441 | - |
dc.citation.number | 12 | - |
dc.citation.startPage | 9433 | - |
dc.citation.title | IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS | - |
dc.citation.volume | 64 | - |
dc.contributor.affiliatedAuthor | Jeong, Hyeyun | - |
dc.contributor.affiliatedAuthor | Lee, Hojin | - |
dc.contributor.affiliatedAuthor | Kim, Sang Woo | - |
dc.identifier.scopusid | 2-s2.0-85032954720 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.wostc | 3 | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | NANOPARTICLES | - |
dc.subject.keywordPlus | MINIMAL INHIBITORY CONCENTRATIONS | - |
dc.subject.keywordPlus | FIELD-EFFECT TRANSISTOR | - |
dc.subject.keywordPlus | ON-A-CHIP | - |
dc.subject.keywordPlus | ESCHERICHIA-COLI | - |
dc.subject.keywordPlus | PSEUDOMONAS-AERUGINOSA | - |
dc.subject.keywordPlus | ANTIMICROBIAL AGENTS | - |
dc.subject.keywordPlus | BIOFILM FORMATION | - |
dc.subject.keywordPlus | CELL-CULTURE | - |
dc.subject.keywordPlus | PH | - |
dc.relation.journalWebOfScienceCategory | Automation & Control Systems | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalWebOfScienceCategory | Instruments & Instrumentation | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Automation & Control Systems | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Instruments & Instrumentation | - |
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