Thermodynamic theory of stress distribution in epitaxial Pb(Zr, Ti)O-3 thin films
SCIE
SCOPUS
- Title
- Thermodynamic theory of stress distribution in epitaxial Pb(Zr, Ti)O-3 thin films
- Authors
- H. Joon Kim; S. Hoon Oh; Jang, HM
- Date Issued
- 1999-11-15
- Publisher
- AMER INST PHYSICS
- Abstract
- A phenomenological thermodynamic model has been developed to account for the effects of the film thickness on various properties of ferroelectric thin films. To this end, we have suitably incorporated a position-dependent stress distribution function into the elastic Gibbs function. Various physical properties can be predicted as a function of the film thickness using this modified thermodynamic formalism. A comparison of the theoretical predictions with experimental values of the average strain and the para-ferro transition temperature indicates that the tensile stress caused by the cubic-tetragonal displacive phase transition dominates over the compressive thermal stress in the epitaxially oriented tetragonal Pb(Zr, Ti)O-3 thin films. (C) 1999 American Institute of Physics. [S0003-6951(99)05546-1].
- Keywords
- THICKNESS DEPENDENCE
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/9381
- DOI
- 10.1063/1.125275
- ISSN
- 0003-6951
- Article Type
- Article
- Citation
- APPLIED PHYSICS LETTERS, vol. 75, no. 20, page. 3195 - 3197, 1999-11-15
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