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Cited 27 time in webofscience Cited 27 time in scopus
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dc.contributor.authorCheong, HD-
dc.contributor.authorFujisawa, T-
dc.contributor.authorHayashi, T-
dc.contributor.authorHirayama, Y-
dc.contributor.authorJeong, YH-
dc.date.accessioned2015-06-25T01:07:34Z-
dc.date.available2015-06-25T01:07:34Z-
dc.date.created2009-08-05-
dc.date.issued2002-10-21-
dc.identifier.issn0003-6951-
dc.identifier.other2015-OAK-0000002946en_US
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/9424-
dc.description.abstractWe investigate rf transport through an AlGaAs/GaAs single-electron transistor (SET). The presented rf-SET scheme provides a transmission coefficient proportional to the admittance of the device, which is desirable for impedance analysis as well as for high-sensitivity charge detection. The impedance of a SET, including the small tunneling capacitance, is successfully analyzed at the high frequency of 643 MHz, and is compared with a simple model. The ability to measure the impedance of a SET would expand the measurable regime of single-electron tunneling behavior. (C) 2002 American Institute of Physics.-
dc.description.statementofresponsibilityopenen_US
dc.languageEnglish-
dc.publisherAMER INST PHYSICS-
dc.relation.isPartOfAPPLIED PHYSICS LETTERS-
dc.rightsBY_NC_NDen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.0/kren_US
dc.titleImpedance analysis of a radio-frequency single-electron transistor-
dc.typeArticle-
dc.contributor.college전자전기공학과en_US
dc.identifier.doi10.1063/1.1515883-
dc.author.googleCheong, HDen_US
dc.author.googleFujisawa, Ten_US
dc.author.googleJeong, YHen_US
dc.author.googleHirayama, Yen_US
dc.author.googleHayashi, Ten_US
dc.relation.volume81en_US
dc.relation.issue17en_US
dc.relation.startpage3257en_US
dc.relation.lastpage3259en_US
dc.contributor.id10106021en_US
dc.relation.journalAPPLIED PHYSICS LETTERSen_US
dc.relation.indexSCI급, SCOPUS 등재논문en_US
dc.relation.sciSCIen_US
dc.collections.nameJournal Papersen_US
dc.type.rimsART-
dc.identifier.bibliographicCitationAPPLIED PHYSICS LETTERS, v.81, no.17, pp.3257 - 3259-
dc.identifier.wosid000178624900047-
dc.date.tcdate2019-01-01-
dc.citation.endPage3259-
dc.citation.number17-
dc.citation.startPage3257-
dc.citation.titleAPPLIED PHYSICS LETTERS-
dc.citation.volume81-
dc.contributor.affiliatedAuthorJeong, YH-
dc.identifier.scopusid2-s2.0-79956059828-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc24-
dc.description.scptc25*
dc.date.scptcdate2018-10-274*
dc.type.docTypeArticle-
dc.subject.keywordPlusQUANTUM-DOT-
dc.subject.keywordPlusSPECTROSCOPY-
dc.subject.keywordPlusBLOCKADE-
dc.subject.keywordPlusCOULOMB-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-

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정윤하JEONG, YOON HA
Dept of Electrical Enginrg
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