Open Access System for Information Sharing

Login Library

 

Article
Cited 57 time in webofscience Cited 59 time in scopus
Metadata Downloads
Full metadata record
Files in This Item:
There are no files associated with this item.
DC FieldValueLanguage
dc.contributor.authorLim, Seokjae-
dc.contributor.authorSung, Changhyuck-
dc.contributor.authorKim, Hyungjun-
dc.contributor.authorKim, Taesu-
dc.contributor.authorSong, Jeonghwan-
dc.contributor.authorKim, Jae-Joon-
dc.contributor.authorHwang, Hyunsang-
dc.date.accessioned2018-12-28T06:36:35Z-
dc.date.available2018-12-28T06:36:35Z-
dc.date.created2018-03-22-
dc.date.issued2018-02-
dc.identifier.issn0741-3106-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/94607-
dc.description.abstractIn this letter, we demonstrate the conductive-bridging RAM (CBRAM) with excellent multi-level cell (MLC) and linear conductance characteristics for an artificial synaptic device of neuromorphic systems. Our findings show that inherent characteristics of CBRAM can achieve the linear conductance and MLC characteristics as a product of an integer unit of the conductance. However, uncontrolled metal-ion injection into the switching layer results in a significant degradation of device uniformity, leading to degradation in the classification accuracy. Thus, we introduce a multi-layer CBRAM configuration (Cu/HfO2/Ta/Cu2S/W) to control the ionic motion in electrolytes. As a result of device engineering, highly improved classification accuracy is achieved using CIFAR-10 data set.-
dc.languageEnglish-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.relation.isPartOfIEEE ELECTRON DEVICE LETTERS-
dc.subjectMetal ions-
dc.subjectMetals-
dc.subjectClassification accuracy-
dc.subjectConductive-bridging RAM (CBRAM)-
dc.subjectDevice engineering-
dc.subjectInherent characteristics-
dc.subjectIon injection-
dc.subjectMulti level cell (MLC)-
dc.subjectNeuromorphic systems-
dc.subjectsynaptic device-
dc.subjectClassification (of information)-
dc.titleImproved Synapse Device With MLC and Conductance Linearity Using Quantized Conduction for Neuromorphic Systems-
dc.typeArticle-
dc.identifier.doi10.1109/LED.2018.2789425-
dc.type.rimsART-
dc.identifier.bibliographicCitationIEEE ELECTRON DEVICE LETTERS, v.39, no.2, pp.312 - 315-
dc.identifier.wosid000424080800037-
dc.date.tcdate2019-02-01-
dc.citation.endPage315-
dc.citation.number2-
dc.citation.startPage312-
dc.citation.titleIEEE ELECTRON DEVICE LETTERS-
dc.citation.volume39-
dc.contributor.affiliatedAuthorLim, Seokjae-
dc.contributor.affiliatedAuthorSung, Changhyuck-
dc.contributor.affiliatedAuthorKim, Hyungjun-
dc.contributor.affiliatedAuthorKim, Taesu-
dc.contributor.affiliatedAuthorSong, Jeonghwan-
dc.contributor.affiliatedAuthorKim, Jae-Joon-
dc.contributor.affiliatedAuthorHwang, Hyunsang-
dc.identifier.scopusid2-s2.0-85040080763-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc3-
dc.type.docTypeArticle-
dc.subject.keywordPlusPERFORMANCE-
dc.subject.keywordPlusMEMORY-
dc.subject.keywordAuthorNeuromorphic system-
dc.subject.keywordAuthorconductive-bridging RAM (CBRAM)-
dc.subject.keywordAuthorsynaptic device-
dc.subject.keywordAuthorlinear conductance-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-

qr_code

  • mendeley

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher

황현상HWANG, HYUNSANG
Dept of Materials Science & Enginrg
Read more

Views & Downloads

Browse