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DEVELOPMENT OF SYNCHROTRON WHITE BEAM X-RAY TOPOGRAPHY FOR CRYSTAL DEFECT INVESTIGATION
- Title
- DEVELOPMENT OF SYNCHROTRON WHITE BEAM X-RAY TOPOGRAPHY FOR CRYSTAL DEFECT INVESTIGATION
- Date Issued
- 2017-05-02
- Publisher
- 한국결정성장학회
- Article Type
- Conference
- Citation
- 한국결정성장학회 춘계학술대회 2017, 2017-05-02
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Related Researcher
- 임근배LIM, GEUN BAE
- Dept of Mechanical Enginrg