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Coherence and pulse duration characterization of the PAL-XFEL in the hard X-ray regime SCIE SCOPUS

Title
Coherence and pulse duration characterization of the PAL-XFEL in the hard X-ray regime
Authors
Yun, KyuseokKim, SungwonKim, DonjinChung, MyungwooJo, WonhyukHwang, HyerimNam, DaewoongKim, SangsooKim, JangwooPark, Sang-YounKim, KyungsookSONG, CHANGYONGLee, SoohyeongKim, Hyunjung
Date Issued
2019-03
Publisher
NATURE PUBLISHING GROUP
Abstract
We characterize the spatial and temporal coherence properties of hard X-ray pulses from the Pohang Accelerator Laboratory X-ray Free Electron Laser (PAL-XFEL, Pohang, Korea). The measurement of the single-shot speckle contrast, together with the introduction of corrections considering experimental conditions, allows obtaining an intrinsic degree of transverse coherence of 0.85 +/- 0.06. In the Self-Amplified Spontaneous Emission regime, the analysis of the intensity distribution of X-ray pulses also provides an estimate for the number of longitudinal modes. For monochromatic and pink (i.e. natural bandwidth provided by the first harmonic of the undulator) beams, we observe that the number of temporal modes is 6.0 +/- 0.4 and 90.0 +/- 7.2, respectively. Assuming a coherence time of 2.06 fs and 0.14 fs for the monochromatic and pink beam respectively, we estimate an average X-ray pulse duration of 12.6 +/- 1.0 fs.
URI
https://oasis.postech.ac.kr/handle/2014.oak/95262
DOI
10.1038/s41598-019-39765-3
ISSN
2045-2322
Article Type
Article
Citation
SCIENTIFIC REPORTS, vol. 9, 2019-03
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