Distributed Bragg reflector consisting of high- and low-refractive-index thin film layers made of the same material
SCIE
SCOPUS
- Title
- Distributed Bragg reflector consisting of high- and low-refractive-index thin film layers made of the same material
- Authors
- Schubert, MF; Xi, JQ; Kim, JK; Schubert, EF
- Date Issued
- 2007-04-02
- Publisher
- AMER INST PHYSICS
- Abstract
- A conductive distributed Bragg reflector (DBR) composed entirely of a single material-indium tin oxide (ITO)-is reported. The high- and low-refractive-index layers of the DBR are deposited by oblique-angle deposition and consist of ITO thin films with low and high porosities, which yield an index contrast of Delta n=0.4. A single-material DBR with three periods achieves a reflectivity of 72.7%, in excellent agreement with theory.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/9561
- DOI
- 10.1063/1.2720269
- ISSN
- 0003-6951
- Article Type
- Article
- Citation
- APPLIED PHYSICS LETTERS, vol. 90, no. 14, 2007-04-02
- Files in This Item:
-
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.