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Distributed Bragg reflector consisting of high- and low-refractive-index thin film layers made of the same material SCIE SCOPUS

Title
Distributed Bragg reflector consisting of high- and low-refractive-index thin film layers made of the same material
Authors
Schubert, MFXi, JQKim, JKSchubert, EF
Date Issued
2007-04-02
Publisher
AMER INST PHYSICS
Abstract
A conductive distributed Bragg reflector (DBR) composed entirely of a single material-indium tin oxide (ITO)-is reported. The high- and low-refractive-index layers of the DBR are deposited by oblique-angle deposition and consist of ITO thin films with low and high porosities, which yield an index contrast of Delta n=0.4. A single-material DBR with three periods achieves a reflectivity of 72.7%, in excellent agreement with theory.
URI
https://oasis.postech.ac.kr/handle/2014.oak/9561
DOI
10.1063/1.2720269
ISSN
0003-6951
Article Type
Article
Citation
APPLIED PHYSICS LETTERS, vol. 90, no. 14, 2007-04-02
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김종규KIM, JONG KYU
Dept of Materials Science & Enginrg
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