Thickness driven spin reorientation transition of epitaxial LaCrO3 films
SCIE
SCOPUS
- Title
- Thickness driven spin reorientation transition of epitaxial LaCrO3 films
- Authors
- Park, Junho; Kim, Dong-Hwan; Lee, Doopyo; Ko, Kyung-Tae; Song, Jong Hyun; Kim, Jae-Young; Koo, Tae-Yeong; Lee, Seung Ran; Park, Jae-Hoon
- Date Issued
- 2018-03
- Publisher
- AMER INST PHYSICS
- Abstract
- We grew fully strained epitaxial LaCrO3 (LCO) films on SrTiO3(001) under layer-by-layer control up to the film thickness of t = 130 nm using a pulsed laser deposition method. The spin axis of the antiferromagnetic LCO film was systematically examined as a function of t by using Cr L-2,L-3-edge x-ray magnetic linear dichroism (XMLD). The XMLD results manifest a spin reorientation transition (SRT) across a transition thickness of t(T) similar to 60 nm. This SRT is well explained in terms of two competing magnetic anisotropy energies of the surface/interface (K-S) and the LCO film itself (K-V). Published by AIP Publishing.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/96051
- DOI
- 10.1063/1.5021950
- ISSN
- 0003-6951
- Article Type
- Article
- Citation
- APPLIED PHYSICS LETTERS, vol. 112, no. 11, 2018-03
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- There are no files associated with this item.
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