DC Field | Value | Language |
---|---|---|
dc.contributor.author | Aldosari, Mansour Sattam | - |
dc.contributor.author | Aslam, Muhammad | - |
dc.contributor.author | Khan, Nasrullah | - |
dc.contributor.author | Ahmad, Liaquat | - |
dc.contributor.author | Jun, Chi-Hyuck | - |
dc.date.accessioned | 2019-04-07T18:54:54Z | - |
dc.date.available | 2019-04-07T18:54:54Z | - |
dc.date.created | 2018-10-10 | - |
dc.date.issued | 2018-02 | - |
dc.identifier.issn | 2169-3536 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/96101 | - |
dc.description.abstract | The combined application of multiple dependent state sampling and the repetitive group sampling (RGS) is an efficient sampling scheme for industrial process monitoring as it combines the advantages of both the sampling schemes. In this paper, a new variance control chart has been proposed, when the interesting quality characteristic follows the normal distribution using the combination of these two efficient sampling schemes called multiple dependent state repetitive sampling. The control chart coefficients and parameters have been estimated through simulation for the in-control process by considering the target in-control average run lengths under different process settings. The efficiency of the proposed chart has been determined by computing the out-of-control ARL for different shift levels. The advantages of the proposed monitoring scheme have been discussed and compared with the existing RGS scheme and the single sampling scheme. A simulated example and a real industrial data have been included to demonstrate the application of the proposed monitoring scheme. It has been observed that the proposed chart is a valuable addition to the toolkit of the quality monitoring personnel. | - |
dc.language | English | - |
dc.publisher | Institute of Electrical and Electronics Engineers Inc. | - |
dc.relation.isPartOf | IEEE Access | - |
dc.title | A New S-2 Control Chart Using Multiple Dependent State Repetitive Sampling | - |
dc.type | Article | - |
dc.identifier.doi | 10.1109/ACCESS.2018.2803040 | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | IEEE Access, v.6, pp.49224 - 49236 | - |
dc.identifier.wosid | 000445409200001 | - |
dc.citation.endPage | 49236 | - |
dc.citation.startPage | 49224 | - |
dc.citation.title | IEEE Access | - |
dc.citation.volume | 6 | - |
dc.contributor.affiliatedAuthor | Jun, Chi-Hyuck | - |
dc.identifier.scopusid | 2-s2.0-85041514182 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | Y | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | MONITORING VARIANCE-COMPONENTS | - |
dc.subject.keywordPlus | PROCESS CAPABILITY INDEX | - |
dc.subject.keywordPlus | SCHEME | - |
dc.subject.keywordPlus | DESIGN | - |
dc.subject.keywordAuthor | Variance chart | - |
dc.subject.keywordAuthor | multiple dependent state sampling | - |
dc.subject.keywordAuthor | repetitive group sampling | - |
dc.subject.keywordAuthor | chi-square distribution | - |
dc.subject.keywordAuthor | average run length | - |
dc.relation.journalWebOfScienceCategory | Computer Science, Information Systems | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalWebOfScienceCategory | Telecommunications | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Computer Science | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Telecommunications | - |
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