Ultrafast Dynamics of a Nucleobase Analogue Illuminated by a Short Intense X-ray Free Electron Laser Pulse
SCIE
SCOPUS
- Title
- Ultrafast Dynamics of a Nucleobase Analogue Illuminated by a Short Intense X-ray Free Electron Laser Pulse
- Authors
- Nagaya, K; Motomura, K.; Kukk, E; Fukuzawa, H; Wada, S; Tachibana, T; Ito, Y; Mondal, S; Sakai, T; Matsunami, K; Koga, R; Ohmura, S; Takahashi, Y.; Kanno, M; Rudenko, A; Nicolas, C; Liu, X. -J; Zhang, Y.; Chen, J; Anand, M; Jiang, Y. H; KIM, DONG EON; Tono, K.; Yabashi, M; Kono, H; Miron, C; Yao, M; Ueda, K
- Date Issued
- 2016-06
- Publisher
- American Physical Society
- Abstract
- Understanding x-ray radiation damage is a crucial issue for both medical applications of x rays and x-ray free-electron-laser (XFEL) science aimed at molecular imaging. Decrypting the charge and fragmentation dynamics of nucleobases, the smallest units of a macro-biomolecule, contributes to a bottom-up understanding of the damage via cascades of phenomena following x-ray exposure. We investigate experimentally and by numerical simulations the ultrafast radiation damage induced on a nucleobase analogue (5-iodouracil) by an ultrashort (10 fs) high-intensity radiation pulse generated by XFEL at SPring-8 Angstrom Compact free electron Laser (SACLA). The present study elucidates a plausible underlying radiosensitizing mechanism of 5-iodouracil. This mechanism is independent of the exact composition of 5-iodouracil and thus relevant to other such radiosensitizers. Furthermore, we found that despite a rapid increase of the net molecular charge in the presence of iodine, and of the ultrafast release of hydrogen, the other atoms are almost frozen within the 10-fs duration of the exposure. This validates single-shot molecular imaging as a consistent approach, provided the radiation pulse used is brief enough.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/96291
- DOI
- 10.1103/PhysRevX.6.021035
- ISSN
- 2160-3308
- Article Type
- Article
- Citation
- Physical Review X, vol. 6, no. 2, page. 021035, 2016-06
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