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Cited 75 time in webofscience Cited 76 time in scopus
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dc.contributor.authorOh, JH-
dc.contributor.authorPeng Wei-
dc.contributor.authorZhenan Bao-
dc.date.accessioned2015-06-25T01:24:38Z-
dc.date.available2015-06-25T01:24:38Z-
dc.date.created2014-09-30-
dc.date.issued2010-12-13-
dc.identifier.issn0003-6951-
dc.identifier.other2015-OAK-0000030339en_US
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/9689-
dc.description.abstractThe effects of n-type doping on the air-stability of vacuum-processed n-channel organic transistors have been investigated using perylene diimides and pyronin B as the active layer and dopant, respectively. Systematic studies on the influence of doping location revealed the n-type doping of bulk active layer or channel region significantly improves air-stability by compensating for the trapped electrons with the donated mobile electrons. Although n-type doping at the electrode contact could readily turn on the devices, it could not confer air-stable electron transport. The described approach would open up opportunities to enable and improve the stability of n-channel organic transistors in air. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3527972]-
dc.description.statementofresponsibilityopenen_US
dc.languageEnglish-
dc.publisherAIP Publishing LLC-
dc.relation.isPartOfAPPLIED PHYSICS LETTERS-
dc.rightsBY_NC_NDen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.0/kren_US
dc.titleMolecular n-type doping for air-stable electron transport in vacuum-processed n-channel organic transistors-
dc.typeArticle-
dc.contributor.college화학공학과en_US
dc.identifier.doi10.1063/1.3527972-
dc.author.googleOh, JHen_US
dc.author.googleWei, Pen_US
dc.author.googleBao, ZNen_US
dc.relation.volume97en_US
dc.relation.issue24en_US
dc.relation.startpage243305en_US
dc.contributor.id10165224en_US
dc.relation.journalAPPLIED PHYSICS LETTERSen_US
dc.relation.indexSCI급, SCOPUS 등재논문en_US
dc.relation.sciSCIen_US
dc.collections.nameJournal Papersen_US
dc.type.rimsART-
dc.identifier.bibliographicCitationAPPLIED PHYSICS LETTERS, v.97, no.24, pp.243305-
dc.identifier.wosid000285481000079-
dc.date.tcdate2019-01-01-
dc.citation.number24-
dc.citation.startPage243305-
dc.citation.titleAPPLIED PHYSICS LETTERS-
dc.citation.volume97-
dc.contributor.affiliatedAuthorOh, JH-
dc.identifier.scopusid2-s2.0-78650385731-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc53-
dc.description.scptc51*
dc.date.scptcdate2018-10-274*
dc.type.docTypeArticle-
dc.subject.keywordPlusTHIN-FILM TRANSISTORS-
dc.subject.keywordPlusCHARGE-TRANSPORT-
dc.subject.keywordPlusPYRONIN-B-
dc.subject.keywordPlusSEMICONDUCTORS-
dc.subject.keywordPlusDIANHYDRIDE-
dc.subject.keywordPlusDOPANT-
dc.subject.keywordPlusLAYERS-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-

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오준학OH, JOON HAK
Dept. of Chemical Enginrg
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