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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Jun Hyun Han | - |
| dc.contributor.author | Kyung Song | - |
| dc.contributor.author | Shankar Radhakrishnan | - |
| dc.contributor.author | Oh, SH | - |
| dc.contributor.author | Chung Hoon Lee | - |
| dc.date.accessioned | 2015-06-25T01:28:07Z | - |
| dc.date.available | 2015-06-25T01:28:07Z | - |
| dc.date.created | 2013-03-11 | - |
| dc.date.issued | 2012-10-29 | - |
| dc.identifier.issn | 0003-6951 | - |
| dc.identifier.other | 2015-OAK-0000027057 | en_US |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/9746 | - |
| dc.description.abstract | A sub-nanometer scale suspended gap (nanogap) defined by electric field-induced atomically sharp metallic tips is presented. A strong local electric field (>10(9) V/m) across micro/nanomachined tips facing each other causes the metal ion migration in the form of dendrite-like growth at the cathode. The nanogap is fully isolated from the substrate eliminating growth mechanisms that involve substrate interactions. The proposed mechanism of ion transportation is verified using real-time imaging of the metal ion transportation using an in situ biasing in transmission electron microscope (TEM). The configuration of the micro/nanomachined suspended tips allows nanostructure growth of a wide variety of materials including metals, metal-oxides, and polymers. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4764562] | - |
| dc.description.statementofresponsibility | open | en_US |
| dc.language | English | - |
| dc.publisher | Americal Institute of Physics | - |
| dc.relation.isPartOf | Applied Physics Letters | - |
| dc.rights | BY_NC_ND | en_US |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/2.0/kr | en_US |
| dc.title | A Suspended Nanogap Formed by Field-induced Atomically Sharp Tips | - |
| dc.type | Article | - |
| dc.contributor.college | 신소재공학과 | en_US |
| dc.identifier.doi | 10.1063/1.4764562 | - |
| dc.author.google | Han, JH | en_US |
| dc.author.google | Song, K | en_US |
| dc.author.google | Lee, CH | en_US |
| dc.author.google | Oh, SH | en_US |
| dc.author.google | Radhakrishnan, S | en_US |
| dc.relation.volume | 101 | en_US |
| dc.relation.issue | 18 | en_US |
| dc.relation.startpage | 183106 | en_US |
| dc.contributor.id | 10608365 | en_US |
| dc.relation.journal | Applied Physics Letters | en_US |
| dc.relation.index | SCI급, SCOPUS 등재논문 | en_US |
| dc.relation.sci | SCI | en_US |
| dc.collections.name | Journal Papers | en_US |
| dc.type.rims | ART | - |
| dc.identifier.bibliographicCitation | Applied Physics Letters, v.101, no.18, pp.183106 | - |
| dc.identifier.wosid | 000311064500050 | - |
| dc.date.tcdate | 2019-01-01 | - |
| dc.citation.number | 18 | - |
| dc.citation.startPage | 183106 | - |
| dc.citation.title | Applied Physics Letters | - |
| dc.citation.volume | 101 | - |
| dc.contributor.affiliatedAuthor | Oh, SH | - |
| dc.identifier.scopusid | 2-s2.0-84868661406 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
| dc.description.wostc | 8 | - |
| dc.description.scptc | 9 | * |
| dc.date.scptcdate | 2018-10-274 | * |
| dc.type.docType | Article | - |
| dc.subject.keywordPlus | ELECTROMIGRATION | - |
| dc.subject.keywordPlus | FABRICATION | - |
| dc.subject.keywordPlus | MEMORIES | - |
| dc.subject.keywordPlus | CONTACTS | - |
| dc.subject.keywordPlus | DEVICES | - |
| dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Physics | - |
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- 오상호OH, SANG HO
- Dept of Materials Science & Enginrg