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Cited 10 time in webofscience Cited 11 time in scopus
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dc.contributor.authorJoo, S-
dc.contributor.authorJung, KY-
dc.contributor.authorLee, BC-
dc.contributor.authorKim, TS-
dc.contributor.authorShin, KH-
dc.contributor.authorJung, MH-
dc.contributor.authorRho, KJ-
dc.contributor.authorPark, JH-
dc.contributor.authorHong, J-
dc.contributor.authorRhie, K-
dc.date.accessioned2015-06-25T01:28:46Z-
dc.date.available2015-06-25T01:28:46Z-
dc.date.created2012-08-14-
dc.date.issued2012-04-23-
dc.identifier.issn0003-6951-
dc.identifier.other2015-OAK-0000025737en_US
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/9757-
dc.description.abstractThe ferromagnetic layer in magnetic tunnel junctions (MTJs) was oxidized with varying O-2 concentrations, and the corresponding effect on spin-dependent transport was studied. As expected from our previous results for MTJs with an over-oxidized AlOx tunnel barrier, a partially oxidized ferromagnetic layer plays an important role in spin-dependent transport. As the temperature is lowered, the junction resistance increases dramatically, and the tunneling magnetoresistance (TMR) is strongly suppressed. Increasing the O-2 concentration enhances the increase of resistance and suppression of TMR. This work supports our previous conclusion that oxidizing the ferromagnetic layer generates localized magnetic moments, which act as a scattering center for spin-polarized tunneling electrons. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4704557]-
dc.description.statementofresponsibilityopenen_US
dc.languageEnglish-
dc.publisherAMER PHYSICAL SOC-
dc.relation.isPartOfAPPLIED PHYSICS LETTERS-
dc.rightsBY_NC_NDen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.0/kren_US
dc.titleEffect of oxidizing the ferromagnetic electrode in magnetic tunnel junctions on tunneling magnetoresistance-
dc.typeArticle-
dc.contributor.college첨단재료과학부en_US
dc.identifier.doi10.1063/1.4704557-
dc.author.googleJoo, Sen_US
dc.author.googleJung, KYen_US
dc.author.googleRho, KJen_US
dc.author.googleJung, MHen_US
dc.author.googleShin, KHen_US
dc.author.googleKim, TSen_US
dc.author.googleLee, BCen_US
dc.relation.volume100en_US
dc.relation.issue17en_US
dc.relation.startpage172406en_US
dc.contributor.id10080407en_US
dc.relation.journalAPPLIED PHYSICS LETTERSen_US
dc.relation.indexSCI급, SCOPUS 등재논문en_US
dc.relation.sciSCIen_US
dc.collections.nameJournal Papersen_US
dc.type.rimsART-
dc.identifier.bibliographicCitationAPPLIED PHYSICS LETTERS, v.100, no.17, pp.172406-
dc.identifier.wosid000303340300050-
dc.date.tcdate2019-01-01-
dc.citation.number17-
dc.citation.startPage172406-
dc.citation.titleAPPLIED PHYSICS LETTERS-
dc.citation.volume100-
dc.contributor.affiliatedAuthorPark, JH-
dc.identifier.scopusid2-s2.0-84860318539-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc8-
dc.description.scptc8*
dc.date.scptcdate2018-10-274*
dc.type.docTypeArticle-
dc.subject.keywordPlusEXCHANGE MODEL-
dc.subject.keywordPlusANOMALIES-
dc.subject.keywordPlusSTATES-
dc.subject.keywordPlusTRANSISTOR-
dc.subject.keywordPlusDEPENDENCE-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-

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