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Method to estimate profile of threshold voltage degradation in MOSFETs due to electrical stress
- Title
- Method to estimate profile of threshold voltage degradation in MOSFETs due to electrical stress
- Authors
- KANG, BONG KOO; Yeohyeok Yun; Ji-Hoon Seo; Donghee Son
- Date Issued
- 2018-10-02
- Publisher
- Microelectronics Reliability
- Article Type
- Conference
- Citation
- the 29th European Symposium on Reliability of Electron Devices, 2018-10-02
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Related Researcher
- 강봉구KANG, BONG KOO
- Dept of Electrical Enginrg