Conference
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | KIM, JUNG HOON | - |
| dc.contributor.author | Hagiwara, Tomomichi | - |
| dc.date.accessioned | 2019-06-07T23:31:20Z | - |
| dc.date.available | 2019-06-07T23:31:20Z | - |
| dc.date.created | 2019-06-07 | - |
| dc.date.issued | 2015-07-02 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/99094 | - |
| dc.language | English | - |
| dc.publisher | American Automatic Control Council | - |
| dc.relation.isPartOf | American Control Conference | - |
| dc.relation.isPartOf | Proceedings of 2015 American Control Conference | - |
| dc.title | Induced Norm from L2 to L infinity in SISO Sampled-Data Systems | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | American Control Conference, pp.2862 - 2867 | - |
| dc.citation.conferenceDate | 2015-07-01 | - |
| dc.citation.conferencePlace | US | - |
| dc.citation.endPage | 2867 | - |
| dc.citation.startPage | 2862 | - |
| dc.citation.title | American Control Conference | - |
| dc.contributor.affiliatedAuthor | KIM, JUNG HOON | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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