A multiple dependent state repetitive sampling plan for linear profiles

Abstract

In this manuscript, a new multiple dependent state repetitive sampling plan based on the yield index for linear profiles is proposed. The multiple dependent state repetitive sampling plan is more economical than the other sampling plans such as the single sampling plan, the resubmitted sampling plan, and the repetitive sampling plan in terms of the sample size required. The operating characteristic function of the proposed plan is developed for linear profiles. The plan parameters of the proposed sampling plan are determined through a nonlinear optimization problem. The plan parameters are reported for various combinations of acceptable quality level and limiting quality level. The performance of the proposed plan is compared with the single and repetitive group sampling plans. Two real examples are given for practical implementation of the proposed plan.