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Vth Variation Induced by S/D Mole Fraction and Si/SiGe Intermixing of Si-NSFETs

Title
Vth Variation Induced by S/D Mole Fraction and Si/SiGe Intermixing of Si-NSFETs
Authors
Jeong, JinsuYoon, Jun-SikLee, SeunghwanBAEK, ROCK HYUN
Date Issued
2019-02-14
Publisher
KCS
URI
https://oasis.postech.ac.kr/handle/2014.oak/99528
Article Type
Conference
Citation
제26회 한국반도체학술대회 (KCS 2019), 2019-02-14
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백록현BAEK, ROCK HYUN
Dept of Electrical Enginrg
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