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Cited 19 time in webofscience Cited 21 time in scopus
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dc.contributor.authorLee, Dasol-
dc.contributor.authorKim, Minkyung-
dc.contributor.authorKim, Jeonghyun-
dc.contributor.authorHong, Hyeonjun-
dc.contributor.authorBadloe, Trevon-
dc.contributor.authorKim, Dong Sung-
dc.contributor.authorRho, Junsuk-
dc.date.accessioned2019-09-04T02:10:03Z-
dc.date.available2019-09-04T02:10:03Z-
dc.date.created2019-08-28-
dc.date.issued2019-08-
dc.identifier.issn2159-3930-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/99617-
dc.description.abstractMetasurfaces composed of artificially fabricated nano-sized structures have shown extraordinary potential for the precise control of light. Here, we demonstrate for the first time, a metasurface application to reduce the axial size of the point spread function in laser scanning microscopy. The all-dielectric metasurface has wavelength selectivity over the whole visible range, and confinement of the excitation point spread function of the electromagnetic field. These two unique features allow the metasurface to be applied to laser scanning microscope systems. Numerical and experimental demonstrations of the proposed all-dielectric metasurface are reported, showing sharp implicit spectral filtering in the visible range and enhanced axial confinement by observing actin filaments in NIH3T3 cells. We believe that our approach can provide a useful insight on the practicality of using metasurfaces as an imaging platform. (C) 2019 Optical Society of America under the terms of the OSA Open Access Publishing Agreement-
dc.languageEnglish-
dc.publisherOPTICAL SOC AMER-
dc.relation.isPartOfOPTICAL MATERIALS EXPRESS-
dc.titleAll-dielectric metasurface imaging platform applicable to laser scanning microscopy with enhanced axial resolution and wavelength selection-
dc.typeArticle-
dc.identifier.doi10.1364/OME.9.003248-
dc.type.rimsART-
dc.identifier.bibliographicCitationOPTICAL MATERIALS EXPRESS, v.9, no.8, pp.3248 - 3259-
dc.identifier.wosid000478100100006-
dc.citation.endPage3259-
dc.citation.number8-
dc.citation.startPage3248-
dc.citation.titleOPTICAL MATERIALS EXPRESS-
dc.citation.volume9-
dc.contributor.affiliatedAuthorLee, Dasol-
dc.contributor.affiliatedAuthorKim, Minkyung-
dc.contributor.affiliatedAuthorKim, Jeonghyun-
dc.contributor.affiliatedAuthorHong, Hyeonjun-
dc.contributor.affiliatedAuthorBadloe, Trevon-
dc.contributor.affiliatedAuthorKim, Dong Sung-
dc.contributor.affiliatedAuthorRho, Junsuk-
dc.identifier.scopusid2-s2.0-85070791991-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.isOpenAccessY-
dc.type.docTypeArticle-
dc.subject.keywordPlusINTERNAL-REFLECTION FLUORESCENCE-
dc.subject.keywordPlusSILICON NANOSTRUCTURES-
dc.subject.keywordPlusPHASE DISCONTINUITIES-
dc.subject.keywordPlusSTED MICROSCOPY-
dc.subject.keywordPlusCELL-
dc.subject.keywordPlusTOPOGRAPHY-
dc.subject.keywordPlus(IM)-M-5-
dc.subject.keywordPlusADHESION-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryOptics-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaOptics-

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노준석RHO, JUNSUK
Dept of Mechanical Enginrg
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