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BAEK, ROCK HYUN(백록현)
scopus
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Dept of Electrical Engineering(전자전기공학과)
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Publication & Time Cited Count (For the Last 5 years)
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Date issued
2015
1
Type
Article
1
Subject
Bulk
1
fin height (H-fin)
1
fin pitch (FP)
1
FinFET
1
middle-of-the line (MOL)
1
parasitic capacitance
1
RC delay
1
selective deposition
1
system-on-a-Chip (SoC)
1
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SCIE
1
SCOPUS
1
Applied search limites :
Subject
: parasitic capacitance
Date Issued
: 2015
Date Issued
: 2015
Subject
: selective deposition
Subject
: selective deposition
Subject
: middle-of-the line (MOL)
Subject
: Bulk
Subject
: middle-of-the line (MOL)
Journal Registered
: scopus
Date Issued
: 2015
Journal Papers(International)
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Conference Papers(Domestic)
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Article
Investigation of RC Parasitics Considering Middle-of-the-Line in Si-Bulk FinFETs for Sub-14-nm Node Logic Applications
SCIE
SCOPUS
IEEE TRANSACTIONS ON ELECTRON DEVICES, vol. 62, no. 10, page. 3441 - 3444, 2015-10
Jeong, EY
;
Yoon, JS
;
Baek, CK
;
Kim, YR
;
Hong, JH
;
et al
1
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