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BAEK, ROCK HYUN(백록현)
scopus
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Dept of Electrical Engineering(전자전기공학과)
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Publication & Time Cited Count (For the Last 5 years)
Results 1-1 of 1 (Search time: 0.001 seconds).
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Date issued
2018
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Article
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DISPLAYS
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DUAL-GATE STRUCTURE
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GRAIN-BOUNDARY
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MEMORY
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MOSFETS
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POLYSILICON TFT
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REDUCTION
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RELIABILITY
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SEQUENTIAL LATERAL SOLIDIFICATION
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SI
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Article
Impact of geometrical parameters on the electrical performance of network-channel polycrystalline silicon thin-film transistors
SCIE
SCOPUS
JAPANESE JOURNAL OF APPLIED PHYSICS, vol. 57, no. 10, 2018-10
Lee, Junyoung
;
Lee, Hojoon
;
Jin, Bo
;
Oh, Hyeongwan
;
Baek, Sangwon
;
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