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KIM, JONG(김종)
scopus
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Dept of Computer Science & Engineering(컴퓨터공학과)
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Publication & Time Cited Count (For the Last 5 years)
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Date issued
1998
1
Type
Article
1
Subject
built-in current sensor
1
current testing
1
I-DDQ testing
1
reliability
1
testing
1
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SCIE
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SCOPUS
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Journal Registered
: scie
Journal Registered
: scopus
Date Issued
: 1998
Subject
: built-in current sensor
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Article
Design of a built-in current sensor for I-DDQ testing
SCIE
SCOPUS
IEEE JOURNAL OF SOLID-STATE CIRCUITS, vol. 33, no. 8, page. 1266 - 1272, 1998-08
Kim, JB
;
Hong, SJ
;
Kim, J
1
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