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JEON, YO SEB(전요셉)
scopus
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Dept of Electrical Engineering(전자전기공학과)
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Publication & Time Cited Count (For the Last 5 years)
Results 1-1 of 1 (Search time: 0.0 seconds).
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Date issued
2024
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Article
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data-driven approach
1
DEEP
1
Hardware
1
hardware impairments
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learning with noisy labels
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MASSIVE MIMO
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MIMO communication
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model-driven approach
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Multiple-input multiple-output (M...
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Noise measurement
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SCIE
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: learning with noisy labels
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Article
MIMO Detection under Hardware Impairments: Learning with Noisy Labels
SCIE
SCOPUS
IEEE Transactions on Wireless Communications, vol. 23, no. 6, page. 1 - 1, 2024-06
Kwon, Jinman
;
SEUNGHYUN, JEON
;
Jeon, Yo-Seb
;
Poor, H. Vincent
1
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