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JUN, CHI HYUCK(전치혁)
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Dept of Industrial & Management Engineering(산업경영공학과)
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Publication & Time Cited Count (For the Last 5 years)
Results 1-1 of 1 (Search time: 0.001 seconds).
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Date issued
2017
1
Type
Article
1
Subject
Attribute control charts
1
average run length
1
Average run lengths
1
Binomial distribution
1
binomial distribution
1
Control chart
1
Control charts
1
Flowcharting
1
In-control
1
multiple dependent state repetiti...
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SCIE
1
SCOPUS
1
Applied search limites :
Journal Registered
: scie
Subject
: average run length
Subject
: Robustness (control systems)
Subject
: In-control
Subject
: Control chart
Journal Registered
: scie
Subject
: Flowcharting
Subject
: Control chart
Subject
: binomial distribution
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Article
A New Attribute Control Chart Using Multiple Dependent State Repetitive Sampling
SCIE
SCOPUS
IEEE Access, vol. 5, page. 6192 - 6197, 2017-03
Aldosari, M.S.
;
Aslam, M.
;
Jun, C.-H.
1
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