Open Access System for Information Sharing
All
Title
Author
Subject
Login
Library
Help
검색
HOME
Communities & Collections
Researchers
Title
Browse by Researchers
JUN, CHI HYUCK(전치혁)
Department
Dept of Industrial & Management Engineering(산업경영공학과)
Major(s)
-
E-Mail
×
E-Mail
Homepage
Co-researchers
네트워크
×
공저자 목록
뒤로가기
Keyword
Publication & Time Cited Count (For the Last 5 years)
Results 1-1 of 1 (Search time: 0.0 seconds).
Export
EXCEL
BIBTEX
Date issued
1999
1
Type
Article
1
Subject
cluster
1
defects
1
regression
1
semiconductor yield
1
Journal Registered
SCIE
1
SCOPUS
1
Applied search limites :
Journal Registered
: scie
Date Issued
: [1993 TO 1999]
Subject
: defects
Journal Papers(International)
Journal Papers
(Domestic)
Conference Papers(International)
Conference Papers(Domestic)
20 건
100 건
200 건
Article
A simulation-based semiconductor chip yield model incorporating a new defect cluster index
SCIE
SCOPUS
MICROELECTRONICS RELIABILITY, vol. 39, no. 4, page. 451 - 456, 1999-04
Jun, CH
;
Hong, YS
;
Kim, SY
;
Park, KS
;
Park, H
1
Browse
Communities & Collections
Researcher
Title
Login
Library
Help