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JUN, CHI HYUCK(전치혁)
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Dept of Industrial & Management Engineering(산업경영공학과)
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Publication & Time Cited Count (For the Last 5 years)
Results 1-1 of 1 (Search time: 0.0 seconds).
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Date issued
1999
1
Type
Article
1
Subject
backup system
1
criticality level
1
event tree
1
failure rate
1
Gamma prior
1
Journal Registered
SCIE
1
SCOPUS
1
Applied search limites :
Journal Registered
: scie
Journal Registered
: scie
Date Issued
: [1993 TO 1999]
Subject
: backup system
Journal Papers(International)
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(Domestic)
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Conference Papers(Domestic)
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Article
A Bayesian approach to prediction of system failure rates by criticalities under event trees
SCIE
SCOPUS
INTERNATIONAL JOURNAL OF PRODUCTION ECONOMICS, vol. 21916, page. 623 - 628, 1999-04-20
Jun, CH
;
Chang, SY
;
Hong, Y
;
Yang, H
1
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