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JUN, CHI HYUCK(전치혁)
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Dept of Industrial & Management Engineering(산업경영공학과)
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Publication & Time Cited Count (For the Last 5 years)
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Date issued
2006
1
Type
Article
1
Subject
CENSORED SAMPLES
1
double sampling
1
FAILURE
1
LIFE-TEST
1
lot acceptance
1
MIS-SPECIFICATION
1
operating characteristic curve
1
RELIABILITY TESTS
1
SHAPE-PARAMETER
1
single sampling
1
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SCIE
1
SCOPUS
1
Applied search limites :
Journal Registered
: scopus
Journal Registered
: scopus
Date Issued
: [2000 TO 2009]
Date Issued
: 2006
Subject
: double sampling
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Conference Papers(Domestic)
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Article
Variables sampling plans for Weibull distributed lifetimes under sudden death testing
SCIE
SCOPUS
IEEE TRANSACTIONS ON RELIABILITY, vol. 55, no. 1, page. 53 - 58, 2006-03
Jun, CH
;
Balamurali, S
;
Lee, SH
1
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