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JUN, CHI HYUCK(전치혁)
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Dept of Industrial & Management Engineering(산업경영공학과)
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Publication & Time Cited Count (For the Last 5 years)
Results 1-1 of 1 (Search time: 0.001 seconds).
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2017
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Article
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Life-tests
1
Moving averages
1
Parameter setting
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Process monitoring
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Robustness (control systems)
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Test time
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Weibull distribution
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weibull distribution
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: Weibull distribution
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: Process monitoring
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: Control charts
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: Article
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: average run length
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Article
A Time Truncated Moving Average Chart for the Weibull Distribution
SCIE
SCOPUS
IEEE Access, vol. 5, page. 7216 - 7222, 2017-04
Alghamdi, S.A.D.
;
Aslam, M.
;
Khan, K.
;
Jun, C.-H.
1
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