Open Access System for Information Sharing
All
Title
Author
Subject
Login
Library
Help
검색
HOME
Communities & Collections
Researchers
Title
Browse by Researchers
JEONG, YOON HA(정윤하)
Department
Dept of Electrical Engineering(전자전기공학과)
Major(s)
-
E-Mail
×
E-Mail
Homepage
Co-researchers
네트워크
×
공저자 목록
뒤로가기
Keyword
Publication & Time Cited Count (For the Last 5 years)
Results 1-1 of 1 (Search time: 0.0 seconds).
Export
EXCEL
BIBTEX
Date issued
2015
1
Type
Article
1
Subject
ELECTRON
1
IMPACT
1
LEAKAGE
1
MOBILITY MODEL
1
SIMULATION
1
Journal Registered
SCIE
1
SCOPUS
1
Applied search limites :
Date Issued
: 2015
Date Issued
: 2015
Subject
: LEAKAGE
Subject
: LEAKAGE
Subject
: MOBILITY MODEL
Type
: Article
Journal Papers(International)
Journal Papers
(Domestic)
Conference Papers(International)
Conference Papers(Domestic)
20 건
100 건
200 건
Article
Statistical variability study of random dopant fluctuation on gate-all-around inversion-mode silicon nanowire field-effect transistors
SCIE
SCOPUS
APPLIED PHYSICS LETTERS, vol. 106, no. 10, 2015-03-09
Yoon, JS
;
Rim, T
;
Kim, J
;
Kim, K
;
Baek, CK
;
et al
1
Browse
Communities & Collections
Researcher
Title
Login
Library
Help