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JEONG, YOON HA(정윤하)
Department
Dept of Electrical Engineering(전자전기공학과)
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Publication & Time Cited Count (For the Last 5 years)
Results 1-1 of 1 (Search time: 0.001 seconds).
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Date issued
2015
1
Type
Article
1
Subject
ELECTRON
1
IMPACT
1
LEAKAGE
1
MOBILITY MODEL
1
SIMULATION
1
Journal Registered
SCIE
1
SCOPUS
1
Applied search limites :
Date Issued
: [2010 TO 2016]
Date Issued
: 2015
Subject
: LEAKAGE
Type
: Article
Subject
: MOBILITY MODEL
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(Domestic)
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Conference Papers(Domestic)
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Article
Statistical variability study of random dopant fluctuation on gate-all-around inversion-mode silicon nanowire field-effect transistors
SCIE
SCOPUS
APPLIED PHYSICS LETTERS, vol. 106, no. 10, 2015-03-09
Yoon, JS
;
Rim, T
;
Kim, J
;
Kim, K
;
Baek, CK
;
et al
1
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