Open Access System for Information Sharing
All
Title
Author
Subject
Login
Library
Help
검색
HOME
Communities & Collections
Researchers
Title
Browse by Researchers
JEONG, YOON HA(정윤하)
Department
Dept of Electrical Engineering(전자전기공학과)
Major(s)
-
E-Mail
×
E-Mail
Homepage
Co-researchers
네트워크
×
공저자 목록
뒤로가기
Keyword
Publication & Time Cited Count (For the Last 5 years)
Results 1-1 of 1 (Search time: 0.001 seconds).
Export
EXCEL
BIBTEX
Date issued
2015
1
Type
Article
1
Subject
7-nm node
1
FinFET
1
LEAKAGE
1
MODEL
1
parasitic capacitances
1
RC delay
1
Si
1
SIMULATION
1
SOC
1
underlap
1
next >
Journal Registered
SCIE
1
SCOPUS
1
Applied search limites :
Date Issued
: [2010 TO 2016]
Subject
: LEAKAGE
Journal Registered
: scopus
Subject
: FinFET
Subject
: 7-nm node
Subject
: SIMULATION
Journal Papers(International)
Journal Papers
(Domestic)
Conference Papers(International)
Conference Papers(Domestic)
20 건
100 건
200 건
Article
Junction Design Strategy for Si Bulk FinFETs for System-on-Chip Applications Down to the 7-nm Node
SCIE
SCOPUS
IEEE ELECTRON DEVICE LETTERS, vol. 36, no. 10, page. 994 - 996, 2015-10
Yoon, JS
;
Jeong, EY
;
Baek, CK
;
Kim, YR
;
Hong, JH
;
et al
1
Browse
Communities & Collections
Researcher
Title
Login
Library
Help