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JEONG, YOON HA(정윤하)
Department
Dept of Electrical Engineering(전자전기공학과)
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Publication & Time Cited Count (For the Last 5 years)
Results 1-1 of 1 (Search time: 0.001 seconds).
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Date issued
2010
1
Type
Article
1
Subject
Electrostatic discharge (ESD)
1
failure current
1
leakage current (I(leakage))
1
leakage current (I-leakage)
1
nanowire
1
on-resistance (R(on))
1
on-resistance (R-on)
1
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SCIE
1
SCOPUS
1
Applied search limites :
Date Issued
: 2010
Subject
: nanowire
Subject
: on-resistance (R(on))
Subject
: Electrostatic discharge (ESD)
Subject
: nanowire
Subject
: on-resistance (R-on)
Journal Registered
: scopus
Journal Registered
: scie
Journal Papers(International)
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(Domestic)
Conference Papers(International)
Conference Papers(Domestic)
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Article
Investigation of Sub-10-nm Diameter, Gate-All-Around Nanowire Field-Effect Transistors for Electrostatic Discharge Applications
SCIE
SCOPUS
IEEE TRANSACTIONS ON NANOTECHNOLOGY, vol. 9, no. 3, page. 352 - 354, 2010-05
Liu, W
;
Liou, JJ
;
Jiang, Y
;
Singh, N
;
Lo, GQ
;
et al
1
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