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JEONG, YOON HA(정윤하)
Department
Dept of Electrical Engineering(전자전기공학과)
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Publication & Time Cited Count (For the Last 5 years)
Results 1-1 of 1 (Search time: 0.001 seconds).
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Date issued
2015
1
Type
Article
1
Subject
Bulk
1
fin height (H-fin)
1
fin pitch (FP)
1
FinFET
1
middle-of-the line (MOL)
1
parasitic capacitance
1
RC delay
1
selective deposition
1
system-on-a-Chip (SoC)
1
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SCIE
1
SCOPUS
1
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Article
Investigation of RC Parasitics Considering Middle-of-the-Line in Si-Bulk FinFETs for Sub-14-nm Node Logic Applications
SCIE
SCOPUS
IEEE TRANSACTIONS ON ELECTRON DEVICES, vol. 62, no. 10, page. 3441 - 3444, 2015-10
Jeong, EY
;
Yoon, JS
;
Baek, CK
;
Kim, YR
;
Hong, JH
;
et al
1
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